Lattice constant measurement from electron backscatter diffraction patterns
نویسندگان
چکیده
منابع مشابه
Direct detection of electron backscatter diffraction patterns.
We report the first use of direct detection for recording electron backscatter diffraction patterns. We demonstrate the following advantages of direct detection: the resolution in the patterns is such that higher order features are visible; patterns can be recorded at beam energies below those at which conventional detectors usefully operate; high precision in cross-correlation based pattern sh...
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Partially recrystallized samples of 5352 aluminum alloy and pure titanium were sectioned and characterized with automated electron backscatter diffraction (EBSD) in a scanning electron microscope. Pixels were partitioned into recrystallized (annealed state) and unrecrystallized (deformed state) using a criterion based on the confidence index (CI) and the diffraction pattern quality (IQ). Unrecr...
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We present an approach for the simulation of complete electron backscatter diffraction (EBSD) patterns where the relative intensity distributions in the patterns are accurately reproduced. The Bloch wave theory is applied to describe the electron diffraction process. For the simulation of experimental patterns with a large field of view, a large number of reflecting planes has to be taken into ...
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We report a method to obtain the stress of crystalline materials directly from lattice deformation by Hooke's law. The lattice deformation was calculated using the crystallographic orientations obtained from electron backscatter diffraction (EBSD) technology. The stress distribution over a large area was obtained efficiently and accurately using this method. Wurtzite structure gallium nitride (...
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Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction patterns from crystals, constituents of material. Captured patterns can then be used to determine grain morphology, crystallographic orientation and chemistry of present phases, which provide complete characterization of microstructure and strong correlation to both properties and performance of ...
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ژورنال
عنوان ژورنال: Journal of Microscopy
سال: 2017
ISSN: 0022-2720
DOI: 10.1111/jmi.12529